Pool/config:
- record real uids (ra8m1_ek), enable usbtest for espressif s3/p4, then
park ra6m5_ek and ra8m1_ek in boards-skip (ra6m5's usbtest/MSC traffic
can kill the uPD720201 host on its ROM firmware; ra8m1 USBHS bring-up
pending); max32666/nrf54lm20 stay enabled - their MosChip flakiness
never wedges
- re-enable device/usbtest on HS boards (mimxrt1064, ch32v307) now that
uPD720201 firmware 2.0.2.6 fixes the command-ring death; mimxrt1015
stays skipped - its HS battery killed the controller on both ROM and
2.0.2.6 firmware (board-specific); match the moved host-test bundles
(f723 <-> rt1064); skip never-passing tests on the new
nrf5340dk/nrf54lm20dk boards and the detached pico host bundle, each
documented with a comment
Host-controller quirk gating in usbtest.py (auto-skip, self-heals on a
healthy xHCI):
- MosChip MCS9990 EHCI: case 25 (int-OUT never scheduled, FRINDEX bug)
and case 11 (unlinked reads complete short/EREMOTEIO)
- Renesas uPD720201 xHCI: firmware-gated. The card must run firmware
>= 2.0.2.6 (RAM-uploaded - it reverts to ROM on every power cycle):
on older firmware the command ring dies under unlink stress (a
Configure Endpoint command stops completing; the hub worker deadlocks
holding the device lock; only a host power cycle recovers; three
boards reproduced it). usbtest.py reads the FW version register (PCI
config 0x6c) and refuses to run at all on older firmware - hil_test
surfaces that as a failed test with the reason. On current firmware
the full 30-case battery runs (validated FS+HS: metro_m4, f723,
f723-DMA all 30/30).
Scheduling (hil_test.py):
- Shuffle each (board, variant)'s test order with a seeded RNG
(HIL_SHUFFLE_SEED to replay) so usbtest batteries and flash churn spread
across the timeline instead of convoying on one controller.
- Per-controller usbtest + flash semaphores: HIL_USBTEST_PARALLEL
(default 4) concurrent usbtest batteries and HIL_FLASH_PARALLEL
(default 8) concurrent flashes per host controller. Profiled on
uPD720201 firmware 2.0.2.6 across 8/1..12/8: wall time falls
22.2/14.3/12.5/10.8 min at usbtest width 1/2/3/4 and plateaus there;
zero controller errors everywhere; first battery case failures
(leaf-hub bandwidth stretch) appear at 12/8, and flash width 12 only
amplifies flasher-hub contention flakes - so 8/4 is the optimum. A
separate battery-window flash throttle was profiled and dropped.
- Give every example a unique hardcoded USB PID (0x4001-0x4022, usbtest
keeps 0x4010) instead of the PID_MAP interface bitmap: different
examples now always re-enumerate back-to-back, even on boards whose
CPU reset does not drop D+ (WCH CH58x), so the EXAMPLE_PID table and
same-PID adjacency reordering in hil_test.py are gone; only the
variant-boundary same-example repeat needs a swap.
- Report matrix: stable columns with the metric-bearing tests pinned
first (usbtest, cdc_msc_throughput, msc_file_explorer[_freertos]),
the rest alphabetical.
Fail fast:
- enum wait budget 8 s on the first attempt, 4 s on retries; dfu waits
are deadline-based so dfu-util's own runtime counts against the
budget.
A device-absent failure now costs ~3-5x a passing test (20-30 s)
instead of 10-30x (47-150 s).
- CI runs hil_test with --retry 1 and no in-run second pass: a broken
fixture fails the job fast instead of holding the self-hosted runner
for hours and blocking other PRs' HIL jobs. hil_test still writes the
.skip sidecar, so a manual re-run attempt only retests what failed.
Review fixes (multi-agent adversarial review of this commit):
- tinyusb_win_usbser.inf: the PID rework moved five CDC examples onto
even PIDs the INF's odd-only DeviceList never matched (legacy-Windows
usbser binding) - appended 0x4006/4008/400a/4020/4022 to both lists.
- usbtest example: USBTEST_TIER is now overridable and the descriptors
and pumps are tier-conditional, so a board whose DCD cannot serve a
tier lowers it instead of skipping the whole example - RA2A1 (RUSB2
with no isochronous pipe) builds at tier 3 via its BOARD_ define; the
host battery follows the tier advertised in bcdDevice. Tier-4 output
verified byte-identical after the refactor.
- dynamic_configuration's second config derived USB_PID + 11 = 0x4018,
colliding with net_lwip_webserver - now USB_PID + 0x0100, outside the
per-example space. tools/check_example_pids.py (pre-commit hook)
enforces PID uniqueness incl. derived and literal idProduct values.
- usbtest.py firmware gate: matched by device ID (uPD720201/720202,
both use the 0x6c FW register), and an unreadable version (setpci
missing/denied) now refuses with its own message instead of
masquerading as "firmware 0x00000000"; noted the gate is necessary
but not sufficient (board-specific kills stay per-board skips).
- hil_test: deadline waits use time.monotonic(); multiprocessing
context pinned to fork (raw semaphores in Pool initargs); flash and
usbtest permits unified into one fail-closed, exception-safe
ctrl_permit (unknown controller takes every slot and logs a warning
instead of silently borrowing slot 0); an all-skipped battery
reports as skip, not "0/0" failure; slow-body polls (mtp, printer,
disk read) go through a shared deadline-based wait_until so their
bodies count against the enum budget; throughput's FS detection
compares serials case-insensitively like every other walk; a missing
MSC read-speed line now fails the host msc_file_explorer test
instead of passing with an empty metric.
Hardening:
- fail fast (15 s) when a driver-registry sysfs write blocks: a wedged
device otherwise turns every subsequent battery into an unkillable
D-state writer and silently hangs the whole run
- usb-recover skill: a VM reboot is not a reliable cure (MosChip hubs
latch up across the PCIe reset); full host power cycle is
Co-Authored-By: Claude Fable 5 <noreply@anthropic.com>
Claude-Session: https://claude.ai/code/session_01HeF2gZ1M7GWkz6Av4BpKPg
Documentation tooling:
- Add the `build-doc` skill and `tools/build_doc.py` wrapper for local
Sphinx builds (clean / -W / open).
- Enable Markdown (MyST) in conf.py and auto-collect
examples/{device,host,dual}/*/README.md into a 3-level Examples nav
(Examples > Device/Host/Dual > example), noting each page's source
location and normalizing headings to a single H1.
- Remove the stale `.claude/commands/build-doc.md`; point the AGENTS.md
Documentation section at the skill.
Example docs:
- Add a README.md for every device/host/dual example: what it does, USB
interface table, notable tusb_config.h settings, generic CMake + Make
build steps, and how to try it.
- Fold each *_freertos variant into its base README, noting the FreeRTOS
source path and any RTOS-specific behavior.
Generated docs/examples/ output is git-ignored. Builds clean with
`sphinx-build -W`.
Co-Authored-By: Claude Opus 4.8 (1M context) <noreply@anthropic.com>
The BSP family and MCU option were named "ch58x"/"CH58X", but the supported part is
the CH583/CH582 (and the SDK repo is openwch/ch583); CH585 is a separate MCU family,
so the CH58x umbrella was misleading. Rename to the specific family:
- hw/bsp/ch58x -> hw/bsp/ch583 (dir), and the BSP-local files ch58x_it.* ->
ch583_it.*, system_ch58x.* -> system_ch583.* (include guards/refs updated). The
vendor SDK files (CH58x_common.h, CH58x_*.c in hw/mcu/wch/ch583) keep their names.
- OPT_MCU_CH58X -> OPT_MCU_CH583 in tusb_option.h, tusb_mcu.h, and the shared WCH
USBFS driver (ch32_usbfs_reg.h, dcd_ch32_usbfs.c). OPT_MCU_CH582 is kept as an
alias (same value), so either name selects the same code.
- FAMILY_MCUS CH58X -> CH583, CFG_TUSB_MCU=OPT_MCU_CH583, mcu:CH58X -> mcu:CH583 in
the example skip lists, the CI build matrix (ci_set_matrix.py), the get_deps family
tag, and docs/reference/boards.rst.
Board names (ch582m_evt, yd-ch582m) are unchanged. Verified: make + cmake build for
ch582m_evt, and ci.lan HIL (all device examples pass).
Co-Authored-By: Claude Opus 4.8 (1M context) <noreply@anthropic.com>
since HS interrupt endpoint can be up to 1024, 8-bit is not enough.
affected APIs are:
- tud_hid_n_report() / tud_hid_report()
- tud_hid_report_complete_cb()
